International Conference “Scanning Probe Microscopy” (SPM-2018)

International Conference “Scanning Probe Microscopy” (SPM-2018) combined with International Workshop “Modern Nanotechnologies” (IWMN-2018), and International Youth Conference “Functional Imaging of Nanomaterials” (FIN-2018), August 26 – 29, 2018, to be held in Ural Federal University, Ekaterinburg, Russia.


  1. SPM in materials science
  2. PFM, MFM, KPFM, SNOM, ESM, SEM, and related techniques
  3. Tip-enhanced phenomena
  4. Probe lithography and nanoindentation
  5. Biocompatible & organic materials
  6. Multiferroic phenomena and magnetoelectric coupling
  7. Interface and domain engineering
  8. Ferroelectrics, piezoelectrics, and ionic conductors
  9. 1D and 2D nanostructured materials
  10. Theory, modeling, and data processing

Official language: English

General sponsor: holding NT-MDT Spectrum Instruments

Important dates:

Start of online registration: February 01, 2018

Abstract submission deadline: April 15, 2018

Early-bird registration fee: June 10, 2018

Web-site of SPM-2018:


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